MM 18: SYM Thin Film Magnetic Materials: Microstructure, Reaction and Magnetic Coupling I
Dienstag, 26. Februar 2008, 10:15–11:15, H 0107
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10:15 |
MM 18.1 |
Hauptvortrag:
Local Probing of Magnetic Properties by Electron Microscopy — •Josef Zweck
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10:45 |
MM 18.2 |
Nanoscale characterization of electroplated, thick permalloy films — •Michael R. Koblischka, Saleh Getlawi, Martin Theis, Anjela Koblischka-Veneva, Monika Saumer, and Uwe Hartmann
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11:00 |
MM 18.3 |
Misorientations in magnetite thin films studied by electron backscatter diffraction — Anjela Koblischka-Veneva, •Michael R. Koblischka, Sunil Arora, Shane Murphy, Frank Mücklich, Uwe Hartmann, and Igor Shvets
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