Berlin 2008 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 40: SYM Hydrogen in Materials: New Developments IV
MM 40.2: Vortrag
Donnerstag, 28. Februar 2008, 17:00–17:20, H 1058
XRD, XPS and Raman analysis of metal and complex hydrides — •Isabel Llamas Jansa1, Carine Rongeat1, Steffen Oswald2, Angelika Teresiak2, Martin Kalbác3, and Oliver Gutfleisch1 — 1IFW Dresden, Institute for Metallic Materials, P.O. Box 270016, D-01171 Dresden, Germany — 2IFW Dresden, Institute for Complex Materials, P.O. Box 270016, D-01171 Dresden, Germany — 3IFW Dresden, Institute for Solid State Research, P.O. Box 270016, D-01171 Dresden, Germany
X-ray diffraction (XRD), photoelectron spectroscopy (XPS), and Raman spectroscopy, preferentially as in-situ techniques, are valuable tools for
the characterisation of the chemical state and structure of doped metal- and complex-hydrides and their intermediate products upon absorption
and desorption. Examples for ex- and in-situ characterisation of the evolution with temperature and pressure of doped-NaAlH4 [1] and reactive
hydride composites [2] (e.g. LiBH4 + MgCl2) are discussed. XPS surface analyses indicated the complete decomposition of the catalyst in the
case of TiCl3 doped NaAlH4 samples, whereas samples doped with ScCl3 and CeCl3 still showed traces of the chloride phases. Raman results
demonstrated the formation of the Mg(BH4)2 phase after high-pressure ball milling (HP-BM) of a LiBH4 + MgCl2 mixture for 12 h. Finally,
in-situ XRD was used to monitor the transition from tetrahydride (NaAlH4) into the hexahydride (Na3AlH6) phase during desorption of
sodium alanate.
C. Rongeat, I. Llamas-Jansa, and O. Gutfleisch, in preparation (2007)
U. Boesenberg et al., Acta Materialia 55, 3951 (2007)