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O: Fachverband Oberflächenphysik

O 15: Methods: Other Experimental Techniques I

O 15.4: Vortrag

Montag, 25. Februar 2008, 16:15–16:30, MA 041

Coherent reflectivity using white synchrotron radiation — •Tobias Panzner, Tushar Sant, and Ullrich Pietsch — Universität Siegen, Festkörperphysik, Walter-Flex-Str. 3, 57068 Siegen, Germany

Using coherent white synchrotron radiation in the hard x-ray region for reflectivity experiments one have access to sample properties on a nanometer scale in principle. To extract the wanted information from the performed measurements so called phase retrieval algorithms are necessary. The authors developed a straight forward simulation program based on a spatial limited atomic flat surface to evaluate the influence of different parameters on the coherent scattered signal in the detector plane. These simulations can explain some interesting features of the measurements and shows unexpected results for the influence of the so called illumination function.