Berlin 2008 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 18: Poster Session I - MA 141/144 (Atomic Wires; Size-Selected Clusters; Nanostructures; Metal Substrates: Clean Surfaces+Adsorption of Organic / Bio Molecules+Solid-Liquid Interfaces+Adsorption of O and/or H; Surface or Interface Magnetism; Oxides and Insulators: Clean Surfaces)
O 18.59: Poster
Montag, 25. Februar 2008, 18:30–19:30, Poster F
Modes in dielectric loaded surface plasmon polariton waveguides — •Jan Renger1, Maria Ujué González1, Sukanya Randhawa1, Romain Quidant1, Sébastien Massenot2, Jonathan Grandidier2, Alexandre Bouhelier2, Gerard Colas des Francs2, Laurent Markey2, Jean-Claude Weeber2, and Alain Dereux2 — 1ICFO-Institut de Ciencies Fotoniques, 08860 Castelldefels (Barcelona), Spain — 2Institut Carnot de Bourgogne, UMR 5209 CNRS-Université de Bourgogne, F-21078 Dijon Cedex, France
Surface plasmon polaritons (SPPs) existing at metal/dielectric interfaces feature a high confinement of the electromagnetic field, which make them very promising for small photonic devices and biochemical sensors. Dielectric loading of the metal surface by thin dielectric layers, such as SiO2, can be used to alter the SPP effective mode index neff. In this way, optical elements can be designed by patterning the dielectric layer to get areas with different neff. In particular, SPP waveguides can be obtained by depositing thin SiO2 stripes on top of gold films. We analysed the SPPs on dielectric loaded waveguides having a width down to 100 nm by leakage radiation microscopy. The imaginary part of neff - therewith the propagation length - was measured in the object plane; the real part of neff was determined in the Fourier plane. The measured propagation length for very narrow dielectric stripes is close to the SPP propagation length at the bare metal interface. For increasing width of the dielectric stripes, the additional modes contribute and the propagation length is reduced to the value at an infinite extending dielectric loaded metal film.