O 33: Symposium: Frontiers of Surface Sensitive Electron Microscopy I (Invited Speakers: James Hannon, Raoul van Gastel, Thomas Schmidt)
Dienstag, 26. Februar 2008, 13:45–16:15, MA 005
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13:45 |
O 33.1 |
Hauptvortrag (ohne Erstattung):
Dynamics at Strained Surfaces — •James B. Hannon
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14:15 |
O 33.2 |
Hauptvortrag (ohne Erstattung):
The role of long-range interactions in determining surface morphologies: a combined LEEM/SXRD study — •Raoul van Gastel
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14:45 |
O 33.3 |
Real Time Imaging of Surface Diffusion Fields during Island decay — •Dirk Wall, Kelly R. Roos, Kimberly L. Roos, Ingo Lohmar, Joachim Krug, Michael Horn-von Hoegen, and Frank-J. Meyer zu Heringdorf
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15:00 |
O 33.4 |
Structural imaging of surface oxidation and oxidation catalysis on transition metal surfaces — •Jan Ingo Flege and Peter Sutter
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15:15 |
O 33.5 |
Photoemission electron microscopy investigation of organic thin films — •Maria Benedetta Casu, Indro Biswas, Mathias Nagel, Peter Nagel, Stefan Schuppler, and Thomas Chassé
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15:30 |
O 33.6 |
Characterization of nanosize buried defect in Mo/Si multilayer structure by EUV photoemission electron microscopy — •jingquan lin, jochen maul, nils weber, matthias escher, michael merkel, gerd schoenhense, and ulf kleineberg
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15:45 |
O 33.7 |
Hauptvortrag (ohne Erstattung):
SMART - Spectromicroscopy with aberration correction for high resolution surface characterization — •Th. Schmidt, F. Maier, H. Marchetto, P. Lévesque, U. Groh, R. Fink, H.-J. Freund, E. Umbach, and SMART- Collaboration
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