Berlin 2008 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 43: Poster Session II - MA 141/144 (Surface Spectroscopy on Kondo Systems; Frontiers of Surface Sensitive Electron Microscopy; Methods: Scanning Probe Techniques+Electronic Structure Theory+Other; Time-Resolved Spectroscopy of Surface Dynamics with EUV and XUV Radiation; joined by SYNF posters)
O 43.10: Poster
Dienstag, 26. Februar 2008, 18:30–19:30, Poster F
Strategies for measuring interfacial friction by lateral manipulation of nanoparticles using atomic force microscopy techniques — •T. Mönninghoff1, D. Dietzel1, 2, L. Jansen1, 3, H. Fuchs1, 2, 3, U. D. Schwarz4, and A. Schirmeisen1, 2 — 1Institute of Physics, University of Münster, Germany — 2Forschungszentrum Karlsruhe (FZK), Germany — 3Center for Nanotechnology (CeNTech), University of Münster, Germany — 4Department of Mechanical Engineering, Yale University, New Haven, CT, USA
A promising approach for quantifying interfacial friction is to measure lateral forces during the manipulation of nanoparticles with the atomic force microscope. This technique allows addressing many current issues in the field of nanoscale friction, like the influence of contact size and interface crystallinity, which are not fully accessible with conventional friction force microscopy. We present different manipulation strategies that have been developed to either enable the defined and repeated manipulation of single nanoparticles or to gather statistical data on a larger ensemble of particles found within a particular scan area. Especially the latter approach allows fast and statistically significant data. In all cases, the particle-surface interfacial friction can be extracted from the additional torsional signal of the cantilever during the pushing process in contact mode operation [1]. As a model system for the demonstration of the different manipulation strategies, antimony nanoparticles with different diameters and crystallinity grown on a HOPG substrate have been chosen. [1] Dietzel et al., J. Appl. Phys.102, 084306 (2007)