Berlin 2008 – scientific programme

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O: Fachverband Oberflächenphysik

O 43: Poster Session II - MA 141/144 (Surface Spectroscopy on Kondo Systems; Frontiers of Surface Sensitive Electron Microscopy; Methods: Scanning Probe Techniques+Electronic Structure Theory+Other; Time-Resolved Spectroscopy of Surface Dynamics with EUV and XUV Radiation; joined by SYNF posters)

O 43.19: Poster

Tuesday, February 26, 2008, 18:30–19:30, Poster F

Eddy current microscopy — •Marion Meier, Tino Roll, and Marika Schleberger — Universität Duisburg-Essen, Fachbereich Physik, Lotharstraße 1, D-47048, Germany

Eddy current microscopy (ECM) provides a unique method to gain qualitative insight into the local electrical conductivity of nano structures. ECM is based on the well established method of non-contact scanning force microscopy. The basic principle is as follows: Either the time-dependent magnetic field of an oscillating magnetic probe induces eddy currents within conducting materials or the magnetic stray fields of magnetic domains induce eddy currents within a conducting probe. In any case, the induced currents lead to an electrodynamic interaction between the probe and the sample. Therefore, the oscillation of the probe is damped according to Lenz's rule, leading to a contrast in either the phase or in the damping signal. This technique, thus, provides standard force microscopy with a material sensitive contrast in addition to the conventional topography signal. Since not much is known yet about the experimental limitations of the technique, we used several reference samples such as magnetic recording tapes, conducting wires written by e-beam lithography, and SNOM samples. The latter samples offer the advantage of a high difference in conductivity. We will present results from ex situ as well as from in situ measurements. The method will be applied to nanostructured samples such as thin films and metallic islands on silicon, in order to characterize the influence defects and size effects on the resistivity.