Berlin 2008 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 43: Poster Session II - MA 141/144 (Surface Spectroscopy on Kondo Systems; Frontiers of Surface Sensitive Electron Microscopy; Methods: Scanning Probe Techniques+Electronic Structure Theory+Other; Time-Resolved Spectroscopy of Surface Dynamics with EUV and XUV Radiation; joined by SYNF posters)
O 43.22: Poster
Dienstag, 26. Februar 2008, 18:30–19:30, Poster F
surface velocity of shear quartzes for high speed friction measurements — •fengzhen zhang1, othmar marti1, stefan walheim2, and thomas schimmel2 — 1Uni Ulm — 2Uni Karlsruhe/FZK
Investigations of the friction properties with the relative low speeds(micrometer/s) have been carried out with Atomic Force Microscopy(AFM). Technologically relevant friction processes operate at speeds of several m/s. Due to the limitation of the piezo scanners in standard AFM, a new oscillation setup is required for the microscopic research on high speed friction. We have measured the surface velocity of shear quartzes. In this presentation we show the calibration setup and results of the surface speed for 3MHz quartzes. We discuss the influence of surface inhomogeneities on the accuracy of the velocity measurement. As a first application we present friction measurements obtained on structured films deposited on shear quartzes.