Berlin 2008 – scientific programme

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O: Fachverband Oberflächenphysik

O 43: Poster Session II - MA 141/144 (Surface Spectroscopy on Kondo Systems; Frontiers of Surface Sensitive Electron Microscopy; Methods: Scanning Probe Techniques+Electronic Structure Theory+Other; Time-Resolved Spectroscopy of Surface Dynamics with EUV and XUV Radiation; joined by SYNF posters)

O 43.23: Poster

Tuesday, February 26, 2008, 18:30–19:30, Poster F

Scanning tunneling microscopy measurements of graphene on an insulating substrate. — •Viktor Geringer¹, Sven Runte¹, Marcus Liebmann¹, Tim Echtermeyer², Reinhard Rückamp¹, Max Lemme², and Markus Morgenstern¹ — ¹II. Physikalisches Institut, RWTH Aachen and JARA-FIT, Otto-Blumenthal-Straße, 52074 Aachen — ²Advanced Microelectronic Center Aachen (AMICA), AMO GmbH, Otto-Blumenthal-Str. 25, 52074 Aachen

We present scanning tunneling microscopy (STM) measurements of single and few layer graphene examined under ultrahigh vacuum conditions. The samples were prepared on a silicon dioxide surface by mechanical exfoliation of a graphite crystal and contacted by depositing gold electrodes around the graphene flake. An instrumental challenge in STM investigations of small graphene flakes is the tip positioning with respect to the sample. We solved this technical problem by using an optical long-distance microscope and a x-y-positioning drive for the STM sample stage. A lateral pre-positioning precision of 5-10 μm has been achieved.

We show atomically resolved and large-scale topographic images of the graphene surface as well as first scanning tunneling spectroscopy (STS) results.