Berlin 2008 – scientific programme

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O: Fachverband Oberflächenphysik

O 43: Poster Session II - MA 141/144 (Surface Spectroscopy on Kondo Systems; Frontiers of Surface Sensitive Electron Microscopy; Methods: Scanning Probe Techniques+Electronic Structure Theory+Other; Time-Resolved Spectroscopy of Surface Dynamics with EUV and XUV Radiation; joined by SYNF posters)

O 43.25: Poster

Tuesday, February 26, 2008, 18:30–19:30, Poster F

Development of TERS System with Scanning Capability — •Seth White, Dietrich Wulferding, Alexander Doering, Hongdan Yan, Pushpendra Kumar, and Peter Lemmens — IPKM, TU-Braunschweig

The combination of Tip-Enhanced Raman Spectroscopy with real-time surface characterization in one experimental setup shows great promise as a method for precise local measurement of spatially confined systems. After employing an AFM with an etched [1] nano-apex scanning tip made of Ag or Au[2] to gain structural information one can immediately use the same tip to substantially increase Raman activity at a particular point of interest. Single molecules trapped near the surface of nano-porous oxidized silicon and alumina can be investigated using this finely tunable, highly directed approach.