Berlin 2008 – scientific programme
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O: Fachverband Oberflächenphysik
O 43: Poster Session II - MA 141/144 (Surface Spectroscopy on Kondo Systems; Frontiers of Surface Sensitive Electron Microscopy; Methods: Scanning Probe Techniques+Electronic Structure Theory+Other; Time-Resolved Spectroscopy of Surface Dynamics with EUV and XUV Radiation; joined by SYNF posters)
O 43.8: Poster
Tuesday, February 26, 2008, 18:30–19:30, Poster F
Characterization of W-Tips used in Tuning-Fork Non-Contact Atomic Force Microscopy by Field Ion Microscopy — •Daniel-Alexander Braun1, Jens Falter1,4, Thomas König2, André Schirmeisen1,4, Hendrik Hölscher4, Udo D. Schwarz3, and Harald Fuchs1,4 — 1Institute of Physics, University of Münster, Münster, Germany — 2Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin, Germany — 3Department of Mechanical Engineering, Yale University, New Haven, CT, USA — 4Center for Nanotechnology (CeNTech), University of Münster, Münster, Germany
The atomic force microscope (AFM) is capable to image surfaces with atomic resolution. However, the interpretation of the atomic scale contrast is often difficult and inconclusive. This deficiency is partly caused by the unknown structure of the probing tip, as the chemical interaction between tip and surface and therefore the image contrast is largely determined by the exact configuration of the tip apex. Field ion microscope (FIM) images, on the other hand, enable a complete reconstruction of the atomic geometry of a sharp metallic tip. In this work, we present a special tip holder which can be used in both our home-built AFM and FIM. This combination allows to characterize the exact atomic structure of both interaction partners, the sample and the tip. First results are presented, where the apex radii of electrochemically etched tungsten tips are determined by FIM and subsequently correlated to force distance curves.