Berlin 2008 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 55: Poster Session III - MA 141/144 (Methods: Atomic and Electronic Structure; Particles and Clusters; Heterogeneous Catalysis; Semiconductor Substrates: Epitaxy and Growth+Adsorption+Clean Surfaces+Solid-Liquid Interfaces; Oxides and Insulators: Solid-Liquid Interfaces+Epitaxy and Growth; Phase Transitions; Metal Substrates: Adsorption of Inorganic Molecules+Epitaxy and Growth; Surface Chemical Reactions; Bimetallic Nanosystems: Tuning Physical and Chemical Properties; Oxides and insulators: Adsorption; Organic, polymeric, biomolecular films; etc.)

O 55.26: Poster

Mittwoch, 27. Februar 2008, 18:30–19:30, Poster F

Magnetic in situ characterization by MOKE and Kerr microscopy — •Sani Noor, Carsten Godde, Christian Urban, and Ulrich Köhler — Institut für Experimentalphysik IV, AG Oberflächen, Ruhr-Universität Bochum, Germany

A UHV system is being introduced that offers both the structural analysis by LEED and STM and the magnetic analysis by MOKE and Kerr microscopy of thin films. These can be grown by sets of MBE sources that are pointing at the sample in the STM, MOKE and Kerr microscopy positions allowing in situ measurements respectively. Our focus here shall be the magnetic characterization. The combination of a longitudinal MOKE setup and polar Kerr microscopy, which is based on a long distance microscope, enables the recording of magnetization loops for in and out of plane magnetization. The former provides angular dependent measurements by azimuthal rotation of the sample, the latter can be obtained by spatial integration of the acquired Kerr images. Test measurements have been performed including the study of the anisotropic behaviour of Fe on InAs(001)(4x2) and the Kerr microscopy of FeGd ((0.5 nm Fe/0.5 nm Gd) x 70) multilayers which feature a strong out of plane anisotropy at room temperature as confirmed by SQUID measurements.