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O: Fachverband Oberflächenphysik

O 63: Symposium: Frontiers of Surface Sensitive Electron Microscopy II (Invited Speakers: Jürgen Kirschner, Liviu Chelaru, Michael Bauer, Claus Schneider)

O 63.6: Hauptvortrag (ohne Erstattung)

Donnerstag, 28. Februar 2008, 11:30–12:00, MA 043

Probing thin film magnetism by photoemission microscopy — •Claus M. Schneider — Institut f. Festkörperforschung IFF-9, Forschungszentrum Jülich, D-52425 Jülich, Germany

X-ray photoemission microscopy (X-PEEM) has matured into a versatile tool for high-resolution studies of thin film and surface magnetism. Exploiting the intrinsic time structure of the synchrotron radiation even time-resolved investigations on the sub-nanosecond time scale have become possible. This contribution will address the opportunities and perspectives of photoemission microscopy in the field of magnetism. In this course we will give examples for the information that can be obtained from static XPEEM experiments on the magnetic domain structures and coupling phenomena in heteromagnetic film systems. Time-resolved experiments reveal a wealth of micromagnetic processes governing the dynamics of magnetic microstructures on the nanosecond and sub-nanosecond regime [1].

[1] G. Schönhense, H.-J. Elmers, S.A. Nepijko, and C. M. Schneider, in: Advances in Imaging and Electron Physics Vol. 142, ed. P. Hawkes. (Academic Press, London, 2006).