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O: Fachverband Oberflächenphysik

O 65: Methods: Theory and Experiment

O 65.11: Vortrag

Donnerstag, 28. Februar 2008, 14:30–14:45, MA 141

Commissioning of a dedicated Soft X-Ray energy dispersive beamline for NEXAFS and other CFS/CIS studies — •D. Batchelor¹, Th. Schmidt¹, R. Follath², C. Jung², R. Fink³, A Schöll¹, M. Knupfer⁴, B. Büchner⁴, and E. Umbach^1,5 — ¹Universität Würzburg, Experimentelle Physik II, Würzburg — ²BESSY GmbH, Berlin — ³Physikalische Chemie II, Universität Erlangen-Nürnberg — ⁴IFW Dresden — ⁵Forschungszentrum, Karlsruhe

We have recently published a design for a dedicated Soft X-Ray dispersive beamline (NIMA 575 (2007) 470-475) using photoelectron spectroscopy. The new dispersive technique allows not only NEXAFS without the time-consuming scanning of the photon energy but also high resolution CFS/CIS spectroscopic studies such as Auger/autoionization spectroscopy. The technique provides data with much more accuracy and detail hitherto achieved by simply stepping the photon energy. The method was originally tested using a "Pilot" setup which exploited extending the depth of focus of the monochromator by limiting the beamline angular aperture. Although very successful the decrease in angular beamline aperture obviously had drawbacks in terms of signal and also mode of operation of the monochromator (low Cff values). We will present commissioning results from the upgraded monochromator demonstrating that the new design overcomes most of these difficulties.