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O: Fachverband Oberflächenphysik
O 77: Methods: Scanning Probe Techniques I
O 77.6: Vortrag
Donnerstag, 28. Februar 2008, 16:45–17:00, MA 041
Frequency Modulation Atomic Force Microscopy and Spectroscopy on DPPC in Liquid — •Daniel Ebeling1,2, Hendrik Hölscher1,2, and Boris Anczykowski3 — 1Center for Nanotechnology (CeNTech), Heisenbergstr. 11, 48149 Münster — 2Physikalisches Institut, Wilhelm-Klemm-Str. 10, 48149 Münster — 3nanoAnalytics GmbH, Heisenbergstr. 11, 48149 Münster
The application of dynamic force spectroscopy in vacuum allows the mapping of tip-sample forces down to the atomic-scale. However, it has been shown that dynamic force spectroscopy works also in ambient conditions [1] and liquids [2] enabling the precise measurement of tip-sample forces. By adding a Q-Control electronics to the set-up of the constant-excitation mode of the frequency-modulation atomic force microscope we are able to increase the effective Q-factor of a self-oscillated cantilever in liquid to values comparable to ambient conditions [3]. During imaging of a DPPC bilayer on a mica substrate we observed an increased corrugation of the topography with increased Q-factors. This effect is caused by the reduction of tip-sample indentation forces [4]. Furthermore, dynamic force spectroscopy allows to measure the tip-sample forces and can be used as a powerful tool to determine the mechanical properties of the DPPC bilayer.
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T. Uchihashi et al., Appl. Phys. Lett. 85, 3575 (2004).
D. Ebeling, H. Hölscher, B. Anczykowski, Appl. Phys. Lett. 89, 203511 (2006).
D. Ebeling and H. Hölscher, J. Appl. Phys (accepted).