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O: Fachverband Oberflächenphysik

O 94: Methods: Other Experimental Techniques II

O 94.4: Vortrag

Freitag, 29. Februar 2008, 12:45–13:00, MA 141

XRR investigations of II-VI and III-nitrid based DBR-structures, multilayers and superlattices. — •Radowan Hildebrand, Thomas Schmidt, Ardalan Zargham, Moritz Speckmann, Carsten Kruse, Detlef Hommel, and Jens Falta — Institute of Solid State Physics, University of Bremen, Germany

Thin layers, especially distributed bragg reflectors (DBR), are important components in vertical cavity surface emitting laser (VCSEL)- structures. The investigation of AlN/InGaN and MgS/ZnCdSe DBR structures with the method of x-ray reflection (XRR) enables the determination of electron density, multilayer thickness and roughness of the interfaces. Reducing the roughness is of peculiar interest to achieve high reflective DBRs.