Berlin 2008 – scientific programme

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SYSA: Symposium Tayloring Organic Interfaces: Molecular Structures and Applications

SYSA 5: Poster Session SYSA

SYSA 5.10: Poster

Tuesday, February 26, 2008, 14:30–20:00, Poster A

Investigation of buried metal-organic interface with Photoelectron spectros-copy (PES) — •Pavo Vrdoljak¹, Achim Schöll¹, Friedrich Reinert¹, and Eberhard Umbach² — ¹Universität Würzburg, Experimentelle Physik II, 97074 Würzburg — ²Forschungszentrum Karlsruhe, 76021 Karlsruhe

Metal-organic interfaces are of crucial importance for electronic devices since they influence the layer morphology, the electronic structure at contacts, and the charge carrier transport. Various investigations have addressed this issue from the viewpoint of surface science, applying model systems with thin organic films on flat (single crystalline or amorphous) metal substrates. The contacts in electronic devices, however, can be very different. This is mainly due to the morphological roughness of the interface in case of a metal top contact deposited on an organic layer and the possible influence on the electronic structure. In case of real contacts also interdiffusion has to be taken into account. However, surface sensitive techniques such as photoelectron spectroscopy (PES) and atomic force microscopy (AFM) can not immediately access the buried interface. To tackle this problem we have applied and optimised a lift-off technique which allows the removal of the metal top-contact in the UHV and analyse the interface between the contact and the organic film. We will present first PES and AFM results of Au contacts deposited on PTCDA layers.