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SYSA: Symposium Tayloring Organic Interfaces: Molecular Structures and Applications

SYSA 5: Poster Session SYSA

SYSA 5.14: Poster

Dienstag, 26. Februar 2008, 14:30–20:00, Poster A

Investigation of the influence of substrate temperature on growth, structure and morphology of VTE processed perylene thin films on SiO₂ substrates — •Philip Schulz, Phenwisa Niyamakom, Azadeh Farahzadi, Christian Effertz, Maryam Beigmohamadi, and Matthias Wuttig — Institute of Physics (IA), RWTH Aachen University, 52074 Aachen, Germany

It has been shown recently, that perylene based Organic Thin Film Transistors (OTFTs) are capable to yield high field effect mobilities. The substrate temperature during deposition has a pronounced influence on the growth of perylene thin films processed by Vacuum Thermal Evaporation (VTE). By adjusting this parameter the structure of the film, and in turn its electronic and optical properties, can be controlled in order to tailor the film to suit the specific application.

In this work, perylene thin films have been evaporated on SiO₂ layers held at temperatures between 235 K and 340 K. Subsequently, the structural and optical properties have been determined ex-situ by a set of complementary characterisation techniques.

The morphology of the films is investigated by Atomic Force Microscopy (AFM) yielding the roughness and lateral correlation length. Density and film thickness have been determined from X-ray Reflectometry (XRR). The vertical grain size, microstrain and d-spacing have been extracted from X-ray Diffraction experiments (XRD). The optical constants and anisotropy were analysed by ellipsometry measurements. All results have been correlated to the film adhesion on substrates modified with different surface treatments.