Berlin 2008 – scientific programme

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SYSA: Symposium Tayloring Organic Interfaces: Molecular Structures and Applications

SYSA 5: Poster Session SYSA

SYSA 5.23: Poster

Tuesday, February 26, 2008, 14:30–20:00, Poster A

Monitoring the growth of thin metal phthalocyanine films via Raman scattering — •Britt-Elfriede Schuster¹, Cameliu Himcinschi², Marius Toader², Heiko Peisert¹, Thomas Chassé¹, and Dietrich R. T. Zahn² — ¹Institute of Physical and Theoretical Chemistry, University of Tübingen; Auf der Morgenstelle 8, 72076 Tübingen, Germany. — ²Semiconductor Physics, Chemnitz University of Technology; Reichenhainer Straße 70, 09126 Chemnitz, Germany.

Due to their unique properties, (metal) phthalocyanines (MPc) are highly attractive materials and promising candidates for various applications e.g. in fields of organic light emitting diodes or organic field effect transistors. Since device efficiency and performance are significantly influenced by the physical properties of the thin organic films, intensive studies of the growth and the influence of preparation parameters are very important for thin film technology. In this work the growth of copper(II)phthalocyanine (CuPc) and titanyl(IV)phthalocyanine (TiOPc) on the technically relevant substrate silicon is assessed by in situ monitoring of the Raman scattering of internal vibrational modes to study e.g. the evolution of the polymorphic modifications during the growth and/or the molecular arrangement within the organic layers. The thermal evaporation of metals like silver on the organic films under ultra-high vacuum conditions provides further information about the interface formation. In this regard the occurrence of new Raman modes, normally being infrared active, suggest the interaction of the metal with the phthalocyanine film via a charge transfer.