Berlin 2008 – wissenschaftliches Programm

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SYSA: Symposium Tayloring Organic Interfaces: Molecular Structures and Applications

SYSA 5: Poster Session SYSA

SYSA 5.28: Poster

Dienstag, 26. Februar 2008, 14:30–20:00, Poster A

Initial growth of evaporated copper phthalocyanine thin-films - Comparison of metal and oxide substrates — •Indro Biswas¹, Heiko Peisert¹, Mathias Nagel¹, Maria Benedetta Casu¹, Britt-Elfriede Schuster¹, Stefan Schuppler², Peter Nagel², Michael Merz², and Thomas Chassé¹ — ¹Institut für Physikalische und Theoretische Chemie, Universität Tübingen, Auf der Morgenstelle 8, 72076 Tübingen — ²Institut für Festkörperphysik, Forschungszentrum Karlsruhe, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen

The growth of copper phthalocyanine thin films evaporated on various substrates has been examined in detail, using near-edge x-ray absorption fine structure (NEXAFS) spectroscopy and surface-sensitive x-ray photoemission spectroscopy (SXPS). The focus is on interfaces relevant for technical applications, i.e. metals and oxide conductors as contact electrodes in OLEDs and solar cells, and insulators as dielectric materials in OFETs. The molecular orientation of thin-films in the range of 0.2 to 3.0 nm thickness was examined, with a special focus on the layers directly at the interface. Metal substrates generally lead to an interfacial layer of flat lying molecules, even on rough polycrystalline substrates. On the used oxide substrates (SiO₂) and indium tin oxide) the initial molecular orientation is not lying on rough surfaces, with the exception of a single crystalline substrate (TiO₂). The growth mode is discussed in terms of interfacial and intermolecular interactions and of preparation parameters.