Berlin 2008 – scientific programme

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TT: Fachverband Tiefe Temperaturen

TT 17: Matter at Low Temperature: Measuring Devices, Cryotechnique

TT 17.1: Talk

Tuesday, February 26, 2008, 14:00–14:15, H 2053

First Results of the Resonant Inelastic X-Ray Scattering Station at the ADRESS Beamline at the Swiss Light Source — •Thorsten Schmitt¹, Vladimir Strocov¹, Giacomo Ghiringhelli², Andrea Piazzalunga², Xiaoqiang Wang³, Justina Schlappa¹, Claudia Dallera², Lucio Braicovich², Marco Grioni³, and Luc Patthey¹ — ¹Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland — ²Politecnico di Milano, Italy — ³EPFL Lausanne, Switzerland

Resonant inelastic X-ray scattering (RIXS) is a powerful bulk-sensitive probe of the electronic structure of condensed matter with atomic and orbital sensitivity. It is an unique tool for determining the energy and symmetry of charge neutral electronic excitations (e.g. crystal field or spin-flip excitations) in strongly correlated materials. The ADvanced RESonant Spectroscopies (ADRESS) beamline at the Swiss Light Source (SLS) features advanced instrumentation for RIXS. This year it will be complemented by instrumentation for Angle-Resolved Photoelectron Spectroscopy. The RIXS station is equipped with a spectrometer (resolving power ≈ 12000 for 1 keV) so-called SAXES (Super Advanced X-ray Emission Spectrograph) based on a variable line spacing spherical grating. The RIXS station is open since spring 2007 and was undergoing the operation tests during the 2nd half of 2007. We report on first results obtained with RIXS on transition metal monoxides (NiO, MnO and CuO) as reference compounds. These results demonstrate the capability of this set-up for RIXS studies on strongly correlated materials with unprecedented ultra-high resolution.