Berlin 2008 – scientific programme
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TT: Fachverband Tiefe Temperaturen
TT 3: Transport: Fluctuations and Noise
TT 3.1: Talk
Monday, February 25, 2008, 09:30–09:45, H 2053
Joint counting statistics of voltage and current — •Heidi Förster1, Peter Samuelsson2, and Markus Büttiker1 — 1University of Geneva, Switzerland — 2Lund University, Sweden
Current through a conductor can be characterized by the statistics of transferred charge. Of importance are also internal properties like fluctuations of charge inside the coherent conductor, these quantities can be investigated using voltage and dephasing probes. We determine the joint distribution of charge transferred into contacts and voltage at a voltage probe and compare it with the joint distribution of transferred charge and average occupation number at a dephasing probe. Of particular interest is the manifestation of which path information in the current-voltage correlations in interferometers.
[1] H. Förster, P. Samuelsson, and M. Büttiker, New J. Phys. 9, 117 (2007).
[2] H. Förster, P. Samuelsson, S. Pilgram, and M. Büttiker, Phys. Rev. B 75, 035340 (2007).
[3] S. Pilgram, P. Samuelsson, H. Förster, and M. Büttiker, Phys. Rev. Lett. 97, 066801 (2006).