Darmstadt 2008 – wissenschaftliches Programm
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A: Fachverband Atomphysik
A 13: Posters: Photoionization and atomic systems in external fields
A 13.5: Poster
Dienstag, 11. März 2008, 16:30–18:30, Poster C3
EBIS test ion source for HITRAP and charge breeding — Sabrina Geyer1, Oliver Kester1, Jochen Pfister2, Alexey Sokolov1, Thomas Stoehlker1,3, and •Gleb Vorobjev1 — 1Gesellschaft für Schwerionenforschung — 2Universität Frankfurt, Institut für Angewandte Physik — 3Universität Heidelberg, Fakultät für Physik und Astronomie
The electron beam ion source MAXEBIS from Frankfurt University has been installed in a test beam setup at GSI to deliver highly charged ions for HITRAP and to serve for charge state breeding experiments. Recent experiments were dedicated to evaluate the parameters of the ion beam line, i.e. emittance, dependence of the charge state distribution on the confinement time in the electron beam and the resolution of multi passage spectrometer (MPS). Simulations of the beam-line using SIMION 7.0 were performed add additional elements were installed in order to improve the beam current for more efficient ion transfer. To simplify downstream focusing the setup has been equipped with new diagnostics and beam optics devices. Due to the complicate running procedure of the cryogenic MAXEBIS a next generation compact Dresden electron beam ion trap (EBIT) has been purchased and installed at GSI and will be used for the routine operation. The EBIT will continue the experiments done so far with the MAXEBIS and is dedicated as SPARC test ion source. For ion - neutral atom collision experiments a Magnesium jet target will be mounted. X-ray spectroscopy will allow the investigation of processes of the slow ions - fast electrons interaction in the ionization chamber.