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A: Fachverband Atomphysik

A 30: Precision spectroscopy III

A 30.1: Talk

Friday, March 14, 2008, 14:00–14:15, 3C

Laser Spectroscopy on Trapped Highly-Charged Ions using Soft X-rays from FLASH — •Sascha Epp¹, José Crespo López-Urrutia¹, Günter Brenner¹, Volkhard Mäckel¹, Paul Mokler¹, Joachim Ullrich¹, Rolf Treusch², Marion Kuhlmann², Mikhail Yurkov², Josef Feldhaus², Jochen Schneider², Michael Wellhöfer³, Michael Martins³, and Wilfried Wurth³ — ¹Max-Planck-Institut für Kernphysik, Heidelberg — ²DESY, Hamburg — ³Institut für Experimentalphysik Universität Hamburg

Resonance laser spectroscopy, the most sensitive tool for atomic structure studies, has been severely limited due to the lack of appropriate light sources beyond the UV and especially the VUV region. With FLASH, the free electron laser in Hamburg, the soft x-ray region is now accessible for laser spectroscopy. Therefore transitions in heavy, few-electron systems — i.e. highly charged ions (HCI) — become open to this precision method. Here we report the measurement of the ground state transition between the 1s²2s 2S_1/2 and 1s²2p 2P_1/2 levels for Li-like Fe²³⁺ ions by matching soft x-rays from FLASH together with HCI provided in a transportable EBIT. The present statistical accuracy is already superior to the theoretical uncertainties of the most accurate two-loop QED calculations.