Darmstadt 2008 – wissenschaftliches Programm

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P: Fachverband Plasmaphysik

P III: Poster: Diagnostik, Theorie, Schwerionen- und lasererzeugte Plasmen, Sonstiges

P III.28: Poster

Dienstag, 11. März 2008, 11:00–13:00, Poster C3

Non-Intercepting Beam Profile Measurement and Plasma Analysis based on Fluorescence Diagnostics — •Frank Becker^{1, 2}, Pavel A. Ni³, Dorothea Pfeiffer¹, Prabir K. Roy³, Frank M. Bieniosek³, Peter Forck¹, and Dieter H. H. Hoffmann^{1, 2} — ¹GSI, Darmstadt, Germany — ²TUD, Darmstadt, Germany — ³LBNL, Berkeley, USA

As an alternative to conventional scintillator-based beam profile diagnostics in ion accelerators, with the Beam Induced Fluorescence (BIF) Monitor, transverse beam profiles can be determined by observation of single fluorescence photons emitted by residual gas molecules. With this instrument we recorded profiles of a 10¹² particles per pulse K⁺ beam of 7,7 keV/u in 10⁻⁵ Torr N₂ gas. Single photon counting was performed using an image intensified digital CCD camera. Moreover the applicability of this method has been successfully demonstrated at GSI for various ion beams in the energy range of 5 to 750 MeV/u. Secondly this method can be applied to the study of plasma properties. For a cathodic-arc Al-plasma spatial distribution and plasma density have been investigated. Time resolved spectra were recorded with a streak-spectrometer camera. Results are presented for a typical parameter space, profile distortions and feasibility is discussed.