Bochum 2009 – scientific programme

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HK: Fachverband Hadronen und Kerne

HK 67: Poster Session

HK 67.76: Poster

Thursday, March 19, 2009, 14:00–16:00, Audi-Max

Surface characterisation and surface protection of Germanium detectors — •Tobias Engert¹, Ivan Kojouharov¹, Thomas Krings², and Jürgen Gerl¹ — ¹GSI, 64291 Darmstadt, Germany — ²SEMIKON Detector GmbH, 52428 Juelich, Germany

Abstract: The project includes the characterization of the surfaces of Ge detectors through all necessary processing steps, from the raw crystal to the final detector diode. The aim is to improve the mechanical structure and to reduce surface contaminations, by applying optimized treatment methods. Moreover, a methodology for the design of high purity Germanium detectors is presented. It is motivated by the need for a new mechanical treatment procedure with manufacturing methods for better quality Germanium surfaces and increased cost-efficiency. For the characterisation small Germanium detectors with different surface quality have been prepared and investigated with a Scanning Tunnelling Microscope, an Atomic Force Microscope and a Profiler.