Dresden 2009 – wissenschaftliches Programm

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 28: POSTERS Interfaces and Thin Films

CPP 28.17: Poster

Mittwoch, 25. März 2009, 17:00–19:00, P3

AFM based approach to measure adhesion energies of micron sized particles predicated on JKR apparatus — •Johann Erath and Andreas Fery — University Bayreuth, Universitätsstr. 30, 95440 Bayreuth, Germany

Determination of adhesion energies is of interest for both fundamental science and applications. The aim of this contribution is to introduce a novel, AFM based approach for the case of soft surfaces.

Our approach builds up on the so called JKR (Johnson, Kendall and Roberts) apparatus. This device is used for macroscopic measurements and is based on the fact that the contact area of elastomeric lenses is only dependent on adhesion energy as well as elastic properties and load force. Thus, adhesion energy can be determined from measurement of contact area as a function of load.

In our case, the same principle is used for micron sized particles made from PDMS. Me attach the particles to an AFM setup (soft colloidal probe AFM), whereby one can control the load and simultaneously measure the particle-surface contact area using microinterferometry .

We discuss the potential and advantages of this microscopic approach compared to classic JKR apparatus.