Dresden 2009 – wissenschaftliches Programm

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 32: Polymer Physics III

CPP 32.6: Vortrag

Donnerstag, 26. März 2009, 11:00–11:15, ZEU 222

Combination of µGISAXS and imaging ellipsometry - a new versatile instrument for the surface sensitive investigation of polymer films — •Volker Körstgens¹, Robert Meier¹, Johannes Wiedersich¹, Stephan V. Roth² und Peter Müller-Buschbaum¹ — ¹TU München, Physik-Department LS E13, James-Franck-Str. 1, D-85747 Garching — ²HASYLAB at DESY, Notkestr. 85, D-22607 Hamburg

For the structural investigation of polymer thin films the method µGISAXS (grazing incidence small angle x-ray scattering with a µm-sized beam) is well established and very powerful. It gives access to lateral structures at the surface as well as buried structures of inhomogeneous samples such as gradient films. Whereas in the common set-up available at a few beamlines at synchrotron radiation sources the samples are investigated with µGISAXS and simultaneously with optical microscopy, we introduce an advanced method with in-situ imaging ellipsometry replacing the optical microscopy. Therewith a comprehensive sample characterization is possible including local film thickness and optical properties combined with structural information with a spatial resolution depending on the size of the x-ray beam. The scope of the instrument is illustrated with investigations on different polymer samples. Full capability of the method will be reached with implementation in the newly developed µSAXS/WAXS beamline at the novel high-brilliance synchrotron radiation source PETRA3 at DESY, Hamburg beginning its operation in fall 2009.

This project is financially supported by BMBF grant 05KS7WO1.