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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 40: POSTERS Electronic and Optical Properties

CPP 40.14: Poster

Donnerstag, 26. März 2009, 17:00–19:30, P3

Surface and structure analysis of thin MEH-PPV:PVK polymer blend films — •Robert Meier¹, Matthias A. Ruderer¹, Gunar Kaune¹, Alexander Diethert¹, Stephan V. Roth², and Peter Müller-Buschbaum¹ — ¹TU München, Physik Department LS E13, James-Franck-Straße 1, 85747 Garching — ²HASYLAB at DESY, Notkestraße 85, 22603 Hamburg

The surface and inner structure of novel thin blend films of photoactive conjugated polymers are investigated. Conjugated polymers in thin films become of great interest for versatile applications such as organic thin film transistors, light emitting diodes or photovolatics. We focus on blend films based on MEH-PPV (poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene]) and PVK (poly N-vinylcarbazole) which are prepared with spin coating. It has been shown that, due its charge transfer properties, MEH-PPV is a very promising candidate for applications [1]. The thin films show phase separation at the microscale, which turned out to be very well tuneable via the polymer concentrations in their solution used for preparation. The film surface is characterized by using atomic force microscopy and imaging ellipsometry and the inner film structure is analysed with GIUSAXS and GISANS measurements. The investigation is complemented by probing the conducting properties of the polymer blend films and their light absorbing abilities using UV-Vis spectroscopy.

[1] R. Meier et. al., Physical Review B 77, 195314 (2008)