DS 15: Thin Film Metrology for Electronics, Photonics, and Photovoltaics II
Dienstag, 24. März 2009, 15:15–16:30, GER 38
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15:15 |
DS 15.1 |
Topical Talk:
Investigations of electrophysical properties of thin films with embedded nanoparticles by means of an immitance meter — Viktoria V. Malyutina-Bronskaya, •Valerii B. Zalesskii, and Tamara R. Leonova
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15:45 |
DS 15.2 |
Characterization of strained Si films by variable angle spectroscopic ellipsometry and Raman spectroscopy — •Zhijiat Chong, Martin Weisheit, Michael Hecker, and Ehrenfried Zschech
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16:00 |
DS 15.3 |
Polarization dependent interface properties of ferroelectric Schottky barriers studied by soft X-ray — •Hermann Kohlstedt, Adrian Petraru, Matthias Meiner, Jonathan Denlinger, Jinghua Guo, Wanli Yang, Andreas Scholl, Byron Freelon Freelon, Theo Schneller, Rainer Waser, Pu Yu, and Ramamoorthy Ramesh
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16:15 |
DS 15.4 |
Piezoelectric phenomena in barium titanate thin films observed in nanoscale using piezoresponse force microscopy — •Grzegorz Wielgoszewski, Teodor Gotszalk, Piotr Firek, Jan Szmidt, and Aleksander Werbowy
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