Dresden 2009 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 16: Poster I

DS 16.16: Poster

Dienstag, 24. März 2009, 09:30–12:30, P5

The growth of thin phthalocyanine films probed by Raman scattering — •Britt-Elfriede Schuster¹, Cameliu Himcinschi², Philipp Schäfer², Heiko Peisert¹, Thomas Chassé¹, and Dietrich R. T. Zahn² — ¹Institute of Physical and Theoretical Chemistry, University of Tübingen, Germany. — ²Semiconductor Physics, Chemnitz University of Technology, Germany.

Thorough investigations of thin organic films are basic prerequisites for a comprehensive understanding of morphological, structural and electronic properties of thin organic films. In this context the organic thin film growth is a critical factor, because it is closely connected with e.g., polymorphism and molecular orientation that can depend on the type of substrate material, preparation conditions, and post-growth treatment. Due to their unique properties, phthalocyanines are highly attractive materials and promising candidates for various applications. In this work the growth of thin films of titanyl(IV)phthalocyanine and copper phthalocyanine on silicon prepared by organic molecular beam deposition (OMBD) is assessed by in situ Raman spectroscopy. By monitoring internal vibrational modes under resonance and pre-resonance conditions the evolution of the polymorphic modifications during the thin film growth and/or the molecular arrangement within the organic layers can be studied. The deposition of silver onto the organic thin films under UHV conditions causes surface enhanced Raman scattering signals and provides further information about the metal/organic interface. Atomic force microscopy measurements reveal different surface morphologies after deposition of silver.