Dresden 2009 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 26: Poster II
DS 26.52: Poster
Mittwoch, 25. März 2009, 09:30–12:30, P5
Interfacial effects between thin PMMA-films and solid substrates — •Andreas Weber1, Roland Klein2, and Bernd Stühn1 — 1TU Darmstadt, Experimentelle Physik kondensierter Materie, 64289 Darmstadt, Germany — 2TU Darmstadt, Makromolekulare Chemie, 64287 Darmstadt, Germany
Interfacial effects in thin polymer films affect applications of these films in nanotechnology. Hence there has been much research on this field. One observation is that there may be a few nanometer thick interfacial layer between the polymer and the supporting substrate. Many factors influence the development of these layers: chemical composition of the polymer, characteristics of the polymer as tacticity and molecular weight, character of the substrate and preparation method of the thin film.
X-ray reflectivity measurements allow to investigate the density profiles normal to the surface of such systems at the nanometer scale. The well-known Fresnel reflectivity of the subtrate is superposed by "Kiessig fringes" which are caused by interference due to the thin layer on top of the substrate. Periodicity and amplitude of these fringes are related to the thickness and density of the layers.
We investigate reflectivity data of thin PMMA-films of different tacticity on silicon wafers, glass substrates and polycarbonate discs to study which of the above mentioned factors lead to an interfacial layer. The polymer films are spin-coated onto the substrates. Data analysis is performed by means of a method proposed by Sanyal et al. which bases upon the distorted wave born approximation.