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09:30 |
DS 26.1 |
Glancing angle deposition on differently patterned substrates: influence of pattern period — •Christian Patzig, Joachim Zajadacz, Klaus Zimmer, Renate Fechner, Bodo Fuhrmann, and Bernd Rauschenbach
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09:30 |
DS 26.2 |
Amorphous / nanocrystalline metal-silicide films prepared by surfactant sputtering with low energy ion-beam — •Kun Zhang, Hans Hofsäss, and Hayo Zutz
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09:30 |
DS 26.3 |
Spectroscopic ellipsometry on large-area metamaterials — Julia Braun, •Bruno Gompf, Martin Dressel, and Georg Kabiela
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09:30 |
DS 26.4 |
Compositionally and structurally modified SrTiO3 thin films prepared by chemical solution deposition — •Dirk Spitzner, Emanuel Gutmann, Boris Mahltig, Marianne Reibold, and Dirk C. Meyer
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09:30 |
DS 26.5 |
Erzeugung von Kupfer-Polypyrrol-Kompositschichten durch simultanen PVD/PECVD-Prozess — •Christian Walter und Volker Brüser
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09:30 |
DS 26.6 |
Low temperature aligned deposition of carbon nanotubes for nanoscale interconnects and NEMS applications — •Sascha Hermann, Sergei Loschek, Jens Bonitz, Liu Ping, and Stefan E. Schulz
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09:30 |
DS 26.7 |
Micrometer-sized Isolated Patterns of Conductive ZnO derived by Micromoulding — •Ole F. Göbel, Johan E. ten Elshof, and Dave A. H. Blank
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09:30 |
DS 26.8 |
Design and construction of a novel type of magnetron sputtering deposition system for the growth of multi-component thin films with advanced properties — •Michael Austgen, Dominik Köhl, and Matthias Wuttig
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09:30 |
DS 26.9 |
Deposition and physical properties of thin TiO2 and N-doped TiO2 films prepared by High Power Impulse Magnetron Sputtering — •Vitezslav Stranak, Marion Quaas, Hartmut Steffen, Robert Bogdanowicz, Harm Wulff, Zdenek Hubicka, and Rainer Hippler
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09:30 |
DS 26.10 |
Preparation of dye-sensitised ZnO on textile electrodes by pulsed electrodeposition from nitrate-based aqueous solutions — •Melanie Rudolph, Thomas Loewenstein, Yvonne Zimmermann, Andreas Neudeck, and Derck Schlettwein
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09:30 |
DS 26.11 |
Deposition of SiOx thin films by microwave excited plasma jet — •Manuela Janietz and Thomas Arnold
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09:30 |
DS 26.12 |
Influence of defects on the properties of the conductivity of the LAO/STO interface — •Felix Gunkel, Keisuke Shibuya, Regina Dittmann, and Rainer Waser
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09:30 |
DS 26.13 |
Multilayers as optical elements for X-ray microscopy — •Tobias Liese, Andreas Meschede, and Hans-Ulrich Krebs
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09:30 |
DS 26.14 |
Towards understanding the structure formation of dc magnetron sputtered TiO2 thin films — •Azza Amin, Dominik Koel, and Matthias Wuttig
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09:30 |
DS 26.15 |
In-situ experimental approach to the study of atomic layer deposition with atomic force microscope, X-ray photoelectron and X-ray absorption spectroscopy — •Massimo Tallarida, Konstantin Karavaev, Krzysztof Kolanek, and Dieter Schmeisser
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09:30 |
DS 26.16 |
Crystallization kinetics of ternary germanium-antimony-tellurium phase change alloys — •Malte Linn, Michael Klein, and Matthias Wuttig
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09:30 |
DS 26.17 |
Gold work function reduction by 2.2 eV with an air-stable molecular donor layer — •Benjamin Bröker, Ralf-Peter Blum, Johannes Frisch, Antje Vollmer, Oliver T. Hofmann, Ralph Rieger, Klaus Müllen, Jürgen P. Rabe, Egbert Zojer, and Norbert Koch
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09:30 |
DS 26.18 |
Surface modification of Silicon-Based Light Emitters for smart Biosensing — •Charaf Cherkouk, Lars Rebohle, Wolfgang Skorupa, and Manfred Helm
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09:30 |
DS 26.19 |
Titanium Oxynitride films by Unfiltered Arc Deposition — •Andreas M. Zoll and Roger Thull
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09:30 |
DS 26.20 |
Gold Nano-Dot Matrices for Light-Coupling into Wave-Guided Modes of Thin Membranes — •Susanne Perlt, Marisa Mäder, Thomas Höche, and Bernd Rauschenbach
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09:30 |
DS 26.21 |
A Silver Containing Liquid Alloy Ion Source — •Paul Mazarov, Lothar Bischoff, Wolfgang Pilz, and Andreas D. Wieck
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09:30 |
DS 26.22 |
Alloy Liquid Metal Ion Sources for new FIB applications — •Lothar Bischoff, Wolfgang Pilz, Paul Mazarov, and Andreas Wieck
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09:30 |
DS 26.23 |
Statistical slip step evaluation in CrMn and CrNi cold worked steels by atomic force microscopy — •Nurdogan Gürkan, Gregor Hlawacek, Christian Teichert, Robert Sonnleitner, and Gregor Mori
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09:30 |
DS 26.24 |
Pulsed laser interference lithography — •Stephen Riedel, Matthias Hagner, Paul Leiderer, and Johannes Boneberg
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09:30 |
DS 26.25 |
Optical, electrical and structural characterization of novel phase change materials — •Anja Herpers, Michael Woda, and Matthias Wuttig
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09:30 |
DS 26.26 |
Electronic properties of phase change materials — •Karl Simon Siegert, Carl Schlockermann, Hanno Volker, and Anja Herpers
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09:30 |
DS 26.27 |
Condensation of silicon monoxide studied by infrared spectroscopy — •Steffen Wetzel, Markus Klevenz, Elin Granas, and Annemarie Pucci
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09:30 |
DS 26.28 |
Conductivity of ion tracks in doped tetrahedral amorphous carbon. — •Hans-Gregor Gehrke, Anne-Katrin Nix, Johann Krauser, Christina Trautmann, Alois Weidinger, and Hans Hofsäss
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09:30 |
DS 26.29 |
Time dependency of electric transport in epitaxial PCMO thin films — •Björn-Uwe Meyer, Peter Moschkau, Malte Scherff, Jörg Hoffmann, and Christian Jooss
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09:30 |
DS 26.30 |
Seebeck and Hall measurements on p- and n-TCOs — •Wilma Dewald, Christina Polenzky, Volker Sittinger, and Stefan Götzendörfer
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09:30 |
DS 26.31 |
Transport properties and electronic structure of Al-doped ZnO/Ag/Al-doped ZnO multilayer systems — •Martin Philipp, Christian Hess, Hartmut Vinzelberg, Martin Knupfer, Bernd Büchner, Hadia Gérardin, and Jacques Jupille
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09:30 |
DS 26.32 |
Charge transient spectroscopy measurements of Metal-Oxide-Semiconductor structures — Markus Arnold, •Axel Fechner, Joachim Bollmann, Bernd Schmidt, Heidemarie Schmidt, and Dietrich R.T. Zahn
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09:30 |
DS 26.33 |
VUV Ellipsometry of BiFeO3 thin films grown by pulsed-laser deposition — •Cameliu Himcinschi, Ionela Vrejoiu, Li Ding, Marion Friedrich, Cristoph Cobet, Norbert Esser, Marin Alexe, and Dietrich R.T. Zahn
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09:30 |
DS 26.34 |
Determining the thermal conductivity of thin film single- and multilayers via the 3ω-method — •Erik Mehner, Sebastian Winkler, Stefan Braun, and Dirk C. Meyer
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09:30 |
DS 26.35 |
Tranport properties of ultrathin AlOx interfaces — •Miroslava Dieskova, Peter Bokes, and Andrea Ferretti
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09:30 |
DS 26.36 |
Hydrogenated diamond-like carbon films deposited on UHMW-PE — Annett Dorner-Reisel, Guido Reisel, Gert Irmer, and •Christian Röder
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09:30 |
DS 26.37 |
Transport mechanisms in magnetron sputtered transparent conducting oxide thin films: Correlating electrical properties with deposition conditions and film structure — •Michael Wassen, Dominik Köhl, and Matthias Wuttig
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09:30 |
DS 26.38 |
New microfocus source for X-ray diffractometry of thin films and nano-sized materials — •Jörg Wiesmann, Steffen Kroth, Bernd Hasse, and Carsten Michaelsen
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09:30 |
DS 26.39 |
GIXRD and XRD studies on epitaxial magnetite ultra thin films on MgO(001) — •Florian Bertram, Oliver Hoefert, Martin Suendorf, Bernd Zimmermann, Carsten Deiter, Daniel Bruns, Timo Kuschel, Lars Boewer, Christian Sternemann, Michael Paulus, and Joachim Wollschlaeger
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09:30 |
DS 26.40 |
A Computer Program for the Analysis of High Resolution Rutherford Backscattering Spectra — •Christian Borschel, Martin Schnell, Carsten Ronning, and Hans Hofsäss
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09:30 |
DS 26.41 |
Phase-contrast imaging in soft x-ray scanning transmission microspectroscopy — •Stephan Wenzel, Jörg Raabe, George Tzvetkov, Andreas Späth, and Rainer H. Fink
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09:30 |
DS 26.42 |
Electron Spectroscopy for Chemical Analysis of Copper Oxide thin films — •Andreas Laufer, Thomas Leichtweiß, Swen Graubner, Daniel Reppin, and Bruno K. Meyer
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09:30 |
DS 26.43 |
Deposition of magnesium films using an anodic arc plasma source — •Oleksiy Filipov and Volker Buck
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09:30 |
DS 26.44 |
XPS and UPS investigations of Cs2Te photo cathodes — •Mike Sperling, Ruslan Ovsyannikov, Nadja Kath, Sara Canzio, Hermann Duerr, Antje Vollmer, Sven Lederer, Siegfried Schreiber, Frank Stephan, Paolo Michelato, Laura Monaco, Carlo Pagani, and Daniele Sertore
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09:30 |
DS 26.45 |
Ultrathin magnetite and pure iron films on MgO(100) studied by XRR and XPS — •Bernd Zimmermann, Oliver Höfert, Florian Bertram, Martin Suendorf, Carsten Deiter, Lars Böwer, Michael Paulus, Christian Sternemann, and Joachim Wollschläger
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09:30 |
DS 26.46 |
Surface Electronic Structure Of Perovskite Oxides — •Christoph Raisch, Robert Werner, Reinhold Kleiner, Dieter Koelle, and Thomas Chassé
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09:30 |
DS 26.47 |
Effect of annealing on surface morphology and mechanical properties on electroplated copper thin films — •Anastasia Moskvinova, Olena Chukhrai, Michael Hietschold, Inna Schuebert, and Ramona Ecke
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09:30 |
DS 26.48 |
Formation of metal hydrides of 8b elements under plasma exposure — Marion Quaas, Heiko Ahrens, Oxana Ivanova, •Harm Wulff, and Christiane A. Helm
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09:30 |
DS 26.49 |
In situ noise measurements on ion bombarded thin films: 1/f-noise as a fingerprint for amorphization — •Matthias Noske, Moritz Trautvetter, and Paul Ziemann
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09:30 |
DS 26.50 |
Atom Probe Tomography (APT) on Ti-based Silicide Contact Materials — •Kirsten Wedderhoff, Ahmed Shariq, Clemens Fitz, and Steffen Teichert
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09:30 |
DS 26.51 |
Investigations on the relaxation behavior of metastable tensile strained Si:C alloys — •Ina Ostermay, Andreas Naumann, Felix Ulomek, Thorsten Kammler, and Volker Mohles
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09:30 |
DS 26.52 |
Interfacial effects between thin PMMA-films and solid substrates — •Andreas Weber, Roland Klein, and Bernd Stühn
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09:30 |
DS 26.53 |
Electrical characterization of USJs in Boron doped Si — •Marcel Ogiewa, Michael Zier, and Bernd Schmidt
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09:30 |
DS 26.54 |
Real-time STM growth observations of Mo/Si multilayer systems — •Vincent Fokkema, Jan Verhoeven, and Marcel Rost
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09:30 |
DS 26.55 |
Monte Carlo simulations for focusing elliptical guides — •roxana valicu and peter böni
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09:30 |
DS 26.56 |
Electrochromic properties of WOx thin films on ZnO:Al (AZO) substrates — •Thomas Leichtweiß, Jennifer Stiebich, Angelika Polity, and Bruno K. Meyer
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09:30 |
DS 26.57 |
Influence of TCO substrate on electrochromic properties of WOx thin films — •Jennifer Stiebich, Thomas Leichtweiß, Angelika Polity und Bruno K. Meyer
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09:30 |
DS 26.58 |
Measurements of structural and electrical properties of a pentacene layer in field effect transistors under bending stress — •vitalij scenev, nikolaj severin, Jörn-Oliver Vogel, Zhanh Jian, Stefan eilers, Jürgen Rabe, piero cossedu, analisa bonfiglio, and e orgiu
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09:30 |
DS 26.59 |
Production and characterisation of periodic and chirped La/B4C-multilayer-mirrors for the reflection of ultra short XUV-pulses — •Maike Laß, Stefan Hendel, Florian Bienert, Marc D. Sacher, Wiebke Hachmann, Franz Schäfers, and Ulrich Heinzmann
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09:30 |
DS 26.60 |
Properties of hydrogenated amorphous silicon thin film solar cells deposited at high base pressure — •Jan Woerdenweber, Tsvetelina Merdzhanova, Aad Gordijn, Wolfhard Beyer, Helmut Stiebig, and Uwe Rau
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09:30 |
DS 26.61 |
Photoluminescence Properties of Thin Films of Nanoporous Alumina — •Piotr Hamolka, Igor Vrublevski, Vitaliy Sokol, Dmitriy Shimanovich, and Vladimir Parkoun
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