DS 2: Thin Film Characterisation: Structure Analyse and Composition (XRD, TEM, XPS, SIMS, RBS, ...) II
Monday, March 23, 2009, 14:00–15:30, GER 37
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14:00 |
DS 2.1 |
Nickeldotierung von Diamantnanokristallen zur Erzeugung robuster Einzelphotonquellen — •Marco Wolfer, Armin Kriele, Oliver Williams, Harald Obloh, Crenguta-Columbina Leancu, Lutz Kirste und Christoph Nebel
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14:15 |
DS 2.2 |
Texture analysis on the system Mn4Si7@Si(001): Combining statistical and microscopical information — •Herbert Schletter, Steffen Schulze, Michael Hietschold, Koen De Keyser, Christophe Detavernier, Gunter Beddies, and Meiken Falke
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14:30 |
DS 2.3 |
Studies of interdiffusion and magnetism in magnetic multilayers — •Mathias Schmidt, János Major, Adrian Rühm, Márton Major, Max Nülle, and Helmut Dosch
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14:45 |
DS 2.4 |
Non-destructive speciation of buried nanolayer systems by angle-corrected GIXRF-NEXAFS — •Beatrix Pollakowski and Burkhard Beckhoff
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15:00 |
DS 2.5 |
Channeling irradiation of LiNbO3: Influence of ion energy and ion species — •Tobias Steinbach, Frank Schrempel, Thomas Gischkat, and Werner Wesch
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15:15 |
DS 2.6 |
Gracing incidence FTIR of thin high-k dielectrics — •Wenke Weinreich, Johannes Müller, Martin Rose, Lutz Wilde, Martin Lemberger, Marco Steinert, and Uwe Schröder
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