Dresden 2009 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 9: Poster 1

HL 9.3: Poster

Monday, March 23, 2009, 14:30–17:00, P2

Ab initio investigations of defects in bilayer graphene — •Michael Bachmann and Christian Heiliger — I. Physikalisches Institut, Justus Liebig University Giessen, D-35392, Germany

Recent experimental observations of bilayer graphene using scanning tunnelling microscopy show scattering patterns with a 6-fold symmetry [1,2]. These cannot be explained by substitutional defects which cause scattering patterns with 3-fold symmetry. We report ab initio calculations of defects in bilayer graphene that can explain the 6-fold symmetry of the measured scattering patterns. They do not occur in single layer graphene. They occur if a defect in one layer induces changes in the electronic structure of the other layer. This work has been supported in part by the NIST-CNST/UMD-NanoCenter Cooperative Agreement.

[1] G.M. Rutter, J.N. Crain, N.P. Guisinger, T. Li, N.P. First, J.A. Stroscio, Science 317, 219 (2007)

[2] N.P. Guisinger, G.M. Rutter, J.N. Crain, C. Heiliger, N.P. First, J.A. Stroscio, J. Vac. Sci. Technol. 26, 932 (2008)