Dresden 2009 – scientific programme
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MM: Fachverband Metall- und Materialphysik
MM 35: Poster Session II
MM 35.37: Poster
Wednesday, March 25, 2009, 16:30–18:30, P4
Kinetic and thermodynamic aspects of crystallization in the phase-change material Ge15Sb85 — •Peter Zalden1, Vanessa Coulet2, Christophe Bichara3, Michael Klein1, and Matthias Wuttig1 — 1I. Physikalisches Institut (IA), RWTH Aachen University, 52056 Aachen — 2IM2NP - UMR CNRS 6242, Aix-Marseille Université Campus de Saint Jérôme, case 142, 13397 Marseille — 3CINaM - UPR CNRS 3118, Campus de Luminy - Case 913, 13288 Marseille
Phase-change materials exhibit a very rare combination of properties as they do not only show crystallization on the nanosecond time scale but also show a pronounced change of the optical reflectivity and the electronic resistivity upon crystallization. This property combination is already exploited in rewritable optical data storage and is explored in Phase-Change Memories (PCM), which are considered to be the most promising candidate for future non-volatile electronic data storage.
In this study, structural modifications in sputtered thin films during the transition from the as-deposited amorphous to the crystalline phase are analysed, employing a combination of Differential Scanning Calorimetry and X-Ray Diffraction. This survey includes a systematic study of heat capacities and transition temperatures for different annealing conditions in the amorphous and partially crystallized state. In addition, diffractograms have been recorded ex-situ during different stages of the thermal treatment. These results indicate a segregation of a Ge-rich phase. A comparison to conventional tellurium based phase-change materials is presented.