Dresden 2009 – scientific programme
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O: Fachverband Oberflächenphysik
O 17: Oxides and insulators III
O 17.9: Talk
Tuesday, March 24, 2009, 12:30–12:45, SCH A01
The resonant x-ray absorption coefficient by diffraction peak widths — •Victor Soltwisch, Yevgen Goldshteyn, Enrico Schierle, Detlef Schmitz, and Eugen Weschke — Helmholtz-Zentrum Berlin für Materialien und Energie
The (010) structural reflection of multiferroic DyMnO3 was measured for photon energies across the M5 absorption edge of Dysprosium by resonant soft x-ray diffraction. It is found that the width of this diffraction peak exactly tracks the x-ray absorption spectrum obtained from the same sample by measurement of the total electron yield (TEY). While such a connection has been anticipated, we provide a direct experimental proof. The method is more bulk sensitive than TEY and avoids the problem of self absorption present in fluorescence-yield data. Furthermore, it provides an excellent tool for measurements of the absorption coefficient in insulators at low temperatures or in strong magnetic fields.