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O: Fachverband Oberflächenphysik
O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)
O 27.116: Poster
Dienstag, 24. März 2009, 18:30–21:00, P2
Performance of the XUV split-and-delay line at the free-electron laser in Hamburg — •Florian Sorgenfrei1, Torben Beeck1, Martin Beye1, Alexander Föhlisch1, Mitsuru Nagasono2, Bill Schlotter1, and Wilfried Wurth1 — 1Department Physik, Universität Hamburg, Germany — 2XFEL Project head office, RIKEN, Hyogo, Japan
The high brilliance and short pulse duration of free-electron lasers like FLASH at Hamburg are the basis for novel experiments on ultrafast dynamics in various systems. Combining these properties with X-ray pump/probe techniques enlarges the class of possible experiments even more.
We have permanently implemented a Mach-Zehnder type autocorrelator at the PG2 beamline at FLASH in 2008 which is capable of splitting the XUV pulse from FLASH and introducing a delay between both pulses in the range of about +/- 6ps with a sub-femtosecond resolution. Here, we present the results of test experiments to demonstrate the performance of this device, namely measuring the temporal coherence length of the FLASH radiation and measuring the intensity autocorrelation by He two-photon double-ionization.
We acknowledge financial support from the BMBF priority program FSP301: ”FLASH”and the GrK 1355 ”Physics with new coherent light sources”