Dresden 2009 – scientific programme
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O: Fachverband Oberflächenphysik
O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)
O 27.15: Poster
Tuesday, March 24, 2009, 18:30–21:00, P2
Frictional properties of a mesoscopic contact with engineered surface roughness — •Johannes Sondhauß1, Harald Fuchs1,2, and André Schirmeisen1,2 — 1Institute of Physics, University of Münster, Münster, Germany — 2Center for Nanotechnology (CeNTech), University of Münster, Münster, Germany
Friction force microscopy (FFM) is a standard tool to measure friction down to atomic scales. In this work, we use FFM to investigate the influence of interface roughness of mesoscopic contacts on friction, where both sliding partners, tip and sample, have precisely engineered properties. We use a focused ion beam (FIB) to modify commercial cantilevers in order to firmly attach spherical titanium particles with diameters between 4 and 15 μm. As sample we produce groove-like patterns on a silicon surface with the FIB with a lattice periodicity ranging from 1 to 9 μm and a depth of 25 nm. The average friction force was measured systematically for different tip radii as a function of load and lattice periodicity of the sample grooves. For the 5 μm tip the maximum friction force was found where the geometry of the spherical tip and the lattice are commensurate. These findings highlight the importance of surface structure on tribological properties of mesoscale contacts.