Dresden 2009 – scientific programme

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O: Fachverband Oberflächenphysik

O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)

O 27.18: Poster

Tuesday, March 24, 2009, 18:30–21:00, P2

Eddy current microscopy — •Benedict Kleine Bußmann, Tino Roll, Marion Meier, and Marika Schleberger — Universität Duisburg-Essen, Fachbereich Physik, Lotharstrasse 1, D-47048,Germany

We present eddy current microscopy [1] measurements on geometrically confined conductive structures on insulating substrates. The principle of eddy current microscopy is as follows: A magnetic tip of an Atomic Force Microscope oscillates above a sample and induces eddy currents in the condcucting areas of the sample due to the time-dependent magnetic field they are exposed to. This leads to an electromagnetic interaction between the sample and probe: Thus, according to Lenz's rule a damping of the oscillation occurs and leads to a contrast in the phase and/or dissipation signal[2,3]. By using the well established technique of AFM this method can thus be used to perform conductivity measurements on submicron scale without any need to contact the sample (like for example four-point-probe techniques). We will present measurements we recently performed under ambient conditions as well as in situ measurements.

[1]B. Hoffmann, R. Houbertz, and U. Hartmann, Appl. Phys. A: Mater. Sci. Process. 66, S409 *1998*.

[2]T. Roll, M. Meier, S. Akcöltekin, M. Klusmann, H. Lebius and M. Schleberger Conductive nanodots on the surface of irradiated CaF2 phys. stat. sol. (RRL) 2, 209 (2008) [3] Tino Roll, Marion Meier, Ulrich Fischer and Marika Schleberger Distance dependence of the phase signal in eddy current microscopy Thin Solid Films 516, 8630 (2008)