Dresden 2009 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)
O 27.2: Poster
Dienstag, 24. März 2009, 18:30–21:00, P2
A STM with a scan width from 500 microns down to subnanometers — •Fatih Kalkan and Karina Morgenstern — Institut für Festkörperphysik, Gottfried Wilhelm Leibniz Universität Hannover, Appelstr. 2, D-30167 Hannover, Germany
The scanning tunnelling microscope (STM) is a very powerful tool for exploring the atomic-scale realm of surfaces, and for investigating adsorbate-surface interactions. However, for imaging, e.g. of prestructured surfaces, it would be desirable to bridge the gap between optical spectroscopy and the usual STM scan width. We have constructed a room temperature STM, which has the special ability of scanning with two different scan widths from the optical region down to atomic resolution. We have realised it with two different stages: The first one is a commercial Piezo stage which gives us the possibility of scanning an area up to 500x500 µm2. The second one is a custom-built beetle type STM which scans from several microns down to atomic resolution. This newly designed STM with its wide scan width will allow us to connect the results from atomic-sized structures to the large-scale environment for prestructured surfaces.