Dresden 2009 – scientific programme
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O: Fachverband Oberflächenphysik
O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)
O 27.22: Poster
Tuesday, March 24, 2009, 18:30–21:00, P2
Studies towards Tip Enhanced Raman Scattering with Scanning Capability — •Seth White1,2, Moritz Brendel1, Peter Lemmens1, Dietrich Wulferding1, and Vladimir Gnezdilov1,3 — 1IPKM, TU Braunschweig, Germany — 2MPI-FKF, Stuttgart, Germany — 3ILTP, Kharkov, Ukraine
Tip- and surface-enhanced Raman scattering methods combined with scanning probe microscopy should enable precision measurements on finely structured samples while simultaneously providing local topographical information. A single etched Au[1,2] nano-apex scanning tip could thus be used both for scanning probe investigation and micro-Raman signal enhancement in one instrument. Samples with molecular scale structuring such as impregnated nano-porous silica and alumina are of particular interest in our studies.
[1] Ren et al. (2004), Rev. of Sci. Inst. 75, 4, April 2004
[2] Anderson, Pike (2002), Rev. of Sci. Inst. 73, 3, March 2002