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O: Fachverband Oberflächenphysik

O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)

O 27.24: Poster

Dienstag, 24. März 2009, 18:30–21:00, P2

New scan mode for the NSThM — •Lars Hoelzel, Uli F. Wischnath, and Achim Kittel — Energy and Semiconductor Research Laboratory - University of Oldenburg

The near-field scanning thermal microscope (NSThM)[1] is able to measure the thermal flux between a sharp tip of a STM and a heated or cooled sample surface under ultra-high vacuum conditions. Hence, the main contribution is mediated by evanescent electro-magnetic fields. Up to now the heat flux was investigated in scanning tunnelling mode of the STM on which the NSThM is based on [2]. While the tunnelling current decays on a short length scale the heat flux decays on a roughly ten times larger length scale. First data achieved by a new scanning mode are presented in this contribution. This mode employs a control loop which keeps the heat current constant. Therefore, it is possible to investigate the influence of the surface morphology on the heat flux at larger distances.

[1] Uli F. Wischnath et al., Rev. Sci. Instrum. 79, 073708 (2008)

[2] Achim Kittel et al., Appl. Phys. Lett. 93, 193109 (2008)