Dresden 2009 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 27: Poster Session I (Methods: Scanning probe techniques; Methods: Atomic and electronic structure; Methods: Molecular simulations and statistical mechanics; Oxides and Insulators: Clean surfaces; Oxides and Insulators: Adsorption; Oxides and Insulators: Epitaxy and growth; Semiconductor substrates: Clean surfaces; Semiconductor substrates: Epitaxy and growth; Semiconductor substrates: Adsorption; Nano- optics of metallic and semiconducting nanostructures; Electronic structure; Methods: Electronic structure theory; Methods: other (experimental); Methods: other (theory); Solutions on surfaces; Epitaxial Graphene; Surface oder interface magnetism; Phase transitions; Time-resolved spectroscopies)

O 27.78: Poster

Dienstag, 24. März 2009, 18:30–21:00, P2

New designs of scanning nearfield optical microscopy probes for the time resolved investigation of nanostructures — •Marc Salomo, Bernhard Schaaf, Daniela Bayer, Martin Aeschlimann, and Egbert Oesterschulze — Technische Universität Kaiserslautern, D-67663 Kaiserslautern, Germany

Scanning Nearfield Optical Microscopy (SNOM) is a versatile tool to investigate nanostructured samples. Using a pump-probe setup with a femtosecond laser system as excitation source we have the ability to optically image nanostructures with high spatial and temporal resolution. Another advantage of the probes is the capability to simultaneously perform AFM, thus also gaining topographical information about the sample. This information is essential as local defects on the surface have strong influence on the damping of e.g. localized surface plasmons (LSPs). The nearfield emitted from the SNOM-aperture excites collective electron oscillations. These processes are strongly dependent on the characteristics of the interaction between the sample and the SNOM-tip. Simulations are presented to demonstrate the suitability of the proposed probe designs for time resolved measurements on the subwavelength scale, evaluating transmission capability and pulse dispersion. In the experiment antenna based aperture probes are tailored via focused ion beam milling as well as electron beam lithography of hollow metal coated silicon dioxide pyramids. First measurements on the characterization of the sensors are presented.