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O: Fachverband Oberflächenphysik

O 40: Methods: Scanning probe techniques I

O 40.5: Vortrag

Mittwoch, 25. März 2009, 16:00–16:15, SCH A316

Static and Sliding Friction of Nanoparticles — •Dirk Dietzel, Michael Feldmann, and André Schirmeisen — Institute of Physics and Center for Nanotechnology, University of Münster, Germany

We present a new approach for identifying static and sliding friction during atomic force microscopy (AFM) manipulation of nanoparticles [1]. In this approach the AFM-tip is centered on top of an antimony nanoparticle, which is weakly bound to a graphite surface. Depending on the normal load of the cantilever two scan modes are then possible: At low normal forces the tip will scan on top of the particle, whereas higher normal forces can lead to a movement of the particle simultaneously with the tip. We measure the lateral force during this transition, which allows us to extract values for static as well as sliding friction. We find that the static friction is reproducible during several subsequent manipulation events of the same nanoparticle. Once the particle is moving, further increase of the normal force might also make load dependent friction measurements possible.