O 47: Methods: Scanning probe techniques II
Thursday, March 26, 2009, 10:30–12:30, SCH A316
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10:30 |
O 47.1 |
Investigation of Locally Stored Charges in Silica by Kelvin Probe Force Microscopy — •Carsten Maedler, Harald Graaf, and Christian von Borczyskowski
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10:45 |
O 47.2 |
Towards a quantitative tunneling spectroscopy: Using differential barrier heights for a deconvolution of the tip and sample density of states — •Holger Pfeifer, Berndt Koslowski, Anna Tschetschetkin, and Paul Ziemann
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11:00 |
O 47.3 |
Dynamic Force Microscopy with Small Amplitudes at Ambient Conditions — •Elisabeth Köstner and Franz J. Gießibl
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11:15 |
O 47.4 |
Structural investigations of membrane electrode assemblies (MEA) in fuel cells via environmental scanning electron microscopy (ESEM) — •Susanne Zils, Nathalie Benker, and Christina Roth
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11:30 |
O 47.5 |
Distance and material dependence of the near-field thermal heat transfer — •Robert Berganski, Achim Kittel, and Uli F. Wischnath
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11:45 |
O 47.6 |
Transport of product gases in a scanning mass spectrometer setup — •Matthias Roos, Dan Zhang, Joachim Bansmann, Olaf Deutschmann, and R. Jürgen Behm
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12:00 |
O 47.7 |
HarmoniX microscopy: A new scanning probe microscopy technique for high resolution mapping of material properties — •Udo Volz
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12:15 |
O 47.8 |
Nanometer Resolution of Materials Properties with Scanning Microwave Microscopy — •Matthias Fenner, Wenhai Han, and Hassan Tanbakuchi
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