Dresden 2009 – scientific programme

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SYOP: Symposium Organic Photovoltaics: From Single Molecules to Devices

SYOP 4: Organic Photovoltaics: from Single Molecules to Devices

SYOP 4.40: Poster

Thursday, March 26, 2009, 16:30–19:00, P1A

Infrared Ellipsometry for determination of molecular orientation in DCV6T films — •K. Hinrichs¹, M. Levichkova², M. Riede², M. Pfeiffer³, E. Brier⁴, E. Reinold⁴, P. Baeuerle⁴, and K. Leo² — ¹ISAS - Institute for Analytical Sciences, Department Berlin, 12489 Berlin, Germany — ²Institut für Angewandte Photophysik, TU Dresden, 01062 Dresden, Germany — ³Heliatek GmbH, 01187 Dresden, Germany — ⁴Institut für Organische Chemie II und Neue Materialien, Universität Ulm, 89081 Ulm, Germany

For improving the electronic properties of organic solar cell devices the molecular structure of the organic compounds is of high interest. Films of DCV6T-Eth4(2,2,5,5): α,ω-Bis-(Dicyanovinylen)-Sexithiophene with different thicknesses were prepared by Physical Vapor Deposition (PVD) on silicon substrates. Infrared spectroscopic ellipsometry (IRSE) was used for characterisation. From evaluation of the ellipsometric data in an optical layer model, the film thickness and the anisotropic optical constants of the DCV6T films were determined. It was found that the optical constants strongly depend on the film thickness. Different average molecular orientations were determined for thin and thick (d=4-17.5 nm) films. The deposition at higher substrate temperatures (80 ^∘C) resulted in a higher average molecular tilt angle.