Dresden 2009 – scientific programme

Parts | Days | Selection | Search | Downloads | Help

TT: Fachverband Tiefe Temperaturen

TT 16: Correlated Electrons: Low-dimensional Systems - Materials 1

TT 16.11: Talk

Tuesday, March 24, 2009, 12:30–12:45, HSZ 304

Resonant soft x-ray scattering studies of buried interfaces — •Jochen Geck^1,2, Hiroki Wadati², Enrico Schierle³, P. Kommissinskiy⁴, L. Alff⁴, D.G. Hawthorn⁵, T. Higuchi⁶, Y. Hikita⁶, H.Y. Hwang⁶, S.-W. Huang⁷, D.J. Huang⁷, H.-J. Lin⁷, L.H. Tjeng⁸, H.-H. Wu^7,8, E. Weschke³, C. Schüßler-Langeheine⁸, and G.A. Sawatzky² — ¹IFW Dresden, Germany — ²University of British Columbia, Canada — ³Helmholtz-Zentrum Berlin, Germany — ⁴University of Technology Darmstadt, Germany — ⁵University of Waterloo, Canada — ⁶University of Tokyo, Japan — ⁷National Synchrotron Radiation Research Center, Taiwan — ⁸University of Cologne, Germany

Resonant soft x-ray scattering (RSXS) is a unique experimental tool to access the electronic properties of buried interfaces in heterostructures that contain transition metal oxides. In this contribution, studies of SrTiO₃/LaAlO₃, SrTiO₃/(La,Ca)MnO₃ and NdGaO₃/(La,Ca)MnO₃ interfaces are presented. Specifically, RSXS was employed to examine the electronic reconstruction of Ti 3d and O 2p valence states at the interfaces of SrTiO₃/LaAlO₃ superlattices. Similarly, we used resonant soft x-ray reflectivity to investigate the electronic structure at the interfaces of SrTiO₃/(La,Ca)MnO₃ and NdGaO₃/(La,Ca)MnO₃ thin film systems.