Dresden 2009 – wissenschaftliches Programm

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TT: Fachverband Tiefe Temperaturen

TT 4: Matter at Low Temperature: Cryotechnique, Cryodetectors and Measuring Devices

TT 4.2: Vortrag

Montag, 23. März 2009, 11:45–12:00, HSZ 105

UHV Diffractometer for Soft X-Ray Diffraction at PETRA III — •Christian Schüßler-Langeheine — II. Physikalisches Institut, Universität zu Köln

Resonant diffraction in the soft x-ray range has recently shown to be a powerful technique to study nano-scale order phenomena like charge, orbital and spin order in strongly correlated electron systems.

The XUV beamline of the new synchrotron-radiation source PETRA III in Hamburg with its energy range from 200 eV up to 3 keV will cover the most important resonances of 3d, 4d and 4f systems and will in addition to that provide a high coherent flux. For this beamline an UHV diffractometer suited for resonant and coherent soft x-ray scattering experiments is presently being set up. The experimental possibilities provided by the instrument at that beamline will be discussed with focus on the investigation of order phenomena in strongly correlated electron systems.

Funded by the BMBF through project 05KS7PK1.