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A: Fachverband Atomphysik
A 34: Poster II
A 34.25: Poster
Donnerstag, 5. März 2009, 16:30–19:00, VMP 9 Poster
State selective, angular differential cross sections for electron capture in slow collisions of highly charged argon ions with He and Ne — •Yingli Xue1, 2, Daniel Fischer1, Steven Knoop3, Myroslav Zapukhlyak4, Rainer Ginzel1, Tom Kirchner4, Ronnie Hoekstra3, José R. Crespo López-Urrutia1, Robert Moshammer1, and Joachim Ullrich1 — 1Max-Planck-Institut für Kernphysik, Heidelberg, Germany — 2Institute of Modern Physics, CAS, Lanzhou,China — 3KVI, Atomic Physics, University of Groningen, Groningen, The Netherlands — 4Institut für Theoretische Physik, TU Clausthal, Clausthal-Zellerfeld, Germany
Single and double electron capture in collisions of slow Arq+-ions (q>14) with He and Ne targets have been studied using a ’Reaction Microscope’. For single electron capture, state selective and angular differential cross sections have been obtained. The comparison with the results of a close-coupling approach – the two-center basis-generator method (TC-BGM) – yields good overall agreement [1]. For double electron capture not only the Q-value and the projectile scattering angle but also – in the case of autoionization – the momenta of the emitted electrons have been measured. These results will provide first insight into ultra-fast, femtosecond electron transfer and stabilization mechanisms occurring in slow collisions between highly charged ions and atoms and will represent the most sensitive test for theoretical approaches like TC-BGM.
[1] S. Knoop et al., J. Phys. B 41, (2008) 195203